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X-ray diffraction

There are three DRX instruments available (Bruker D8 Advance) with the following configurations:

 

DRXSystem 1:
Vertical goniometer, Bragg-Brentano  θ-θ configuration, scintillation (NaI), Cu anode without monochromator for filtering the Kα2 line, Ni filter for the Cu Kβ line.

System 2:
Vertical goniometer, Bragg-Brentano  θ-θ configuration, Cu anode, Sol-X detector with discriminator for Kβ line

System 3: Vertical goniometer, Bragg-Brentano θ-2θ configuration, Cu anode with a monochromator for filtering the Kα2 line, PSD LynxEye detector, 9-position rotary sample changer,  goniometer head with rotating capillary for powder diffraction measurements.

 

These instruments allow the measurement of powder spectra in sweep of fixed angle mode, for determination of crystaline and amorphous phases, cuantitative determination of phases and Rietveld analysis.