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Services and prices

CRnE is opened for collaborations with universities, institutes, companies or research groups from UPC which are not associated members. Our services include the main surface characterization techniques we have available:

  • Scanning electron microscopy and focused ion beam (SEM/FIB) with possibility of elemental analysis (EDX),  backscattered electron imaging (atomic contrast Z), surface cross-sectioning for the observation of surface layers/coatings, TEM lamellae preparation, 3D micro- and nano-tomography and volume reconstruction.
  • X-ray diffraction for the analysis of powder and solid samples (DRX).
  • Ultra-high vacuum platform equipped with X-ray photoelectron spectroscopy system for the analysis of surface chemical composition and oxidation state. The vacuum platform has also attached a reaction chamber (pressure up to 20 bar and 800ºC temperature) and an STM-AFM microscope.
  • Infrared spectroscopy (FTIR) with transmission, grazing incidence reflection, attenuated total reflection (ATR) accessories.
  • Ultraviolet and visible light spectroscopy w/o integrating sphere for diffused light collection, liquid and solid samples.
  • Interferometric microscope for surface imaging and analysis - roughness, 3D surface reconstruction, possibility of automated scanning in large areas and map stitching.
  • Surface stylus profiler for roughness analysis, thickness measurements of surface layers/coatings.
  • Optical microscopy in transmission, reflection o polarized light.

See our PRICE LIST. For more information and quotations please contact our technicians at