Microscopy techniques

Our microscopy techniques enable advanced research in nanoscale architectures, microstructural analysis, and material interfaces. We have a wide range of advanced microscopy techniques in-house, ready to support diverse research needs.

• Focused ion beam (FIB/FESEM)
• Desktop scanning electron microscope (SEM)
• Atomic force microscopy (AFM)
• Confocal laser scanning microscopy
• Optical interferometry