Atomic force microscopy (AFM) is a technique in which a sharp physical probe senses the surface locally. To acquire an image the physical probe (tip) is moved on a raster scan over small areas of the sample, measuring the local properties simultaneously. Depending on the interaction between the tip and sample surface, AFM can unveil information about the topography, magnetic structure, electric charge distribution, material contrast, work function, etc. with a resolution below nm. We have 2 AFM VEECO microscopes available.