X-ray photoelectron spectroscopy

The XPS is an analysis technique that provides quantitative and chemical state information from the surface of the material (typically with depths of analysis around 10nm). By irradiating the sample with an X-ray source, photoelectrons are emitted from the surface and its energy is analyzed in order to determine the elemental identity, chemical state and quantity of an element. Bulk samples and powder samples can be analyzed in the system. Our equipment is an ultra-high vacuum multi-chamber system by SPECS.

Key features

Load lock chamber with 8 samples capacity
X-ray photoelectron spectroscopy chamber
PHOIBOS 150 EP hemispherical energy analyzer with MCD-9 detector
XR-50 X-ray source with a twin anode (Al, Mg)
High pressure and high temperature chamber for gas treatments of the samples
Sputtering system for cleaning and depth profiling analysis
SpecsLab Prodigy data acquisition and experiment control software package

Gallery

A brief time-lapse video of how to bake-out the XPS system:

Contact

In order to book the equipment, please contact Judit Buxadera (tecnics.multiescala@upc.edu)

To order an analysis please download and fill out the Application Form (excel / pdf ).