X-ray diffraction

Description

X-ray powder diffraction (XRD) is a technique used for phase identification of a crystalline material. It can be used to identify and quantify crystalline or amorphous phases. In the former case, it also provides information about crystal symmetry and unit cell dimensions. The different configurations of XRD instruments allow measuring on powder samples (also employing the capillary), solids, or deposited films (grazing angle measurements). We have two Bruker D8 Advance diffractometers available.

System 1 key features

  • Bragg-Brentano configuration θ-2θ
  • Grazing angle and capillary configuration
  • Vertical goniometer
  • Cu X-ray tube (up to 40 kV and 40 mA)
  • Sol-X detector with discriminator for the Kβ line and fluorescence effect reduction
  • Without monochromator for the Kα2 line

System 2 key features

  • Bragg-Brentano configuration θ-2θ
  • Vertical goniometer
  • Cu X-ray tube (up to 40 kV and 40 mA)
  • PSD Lynx-Eye detector with monochromator
  • 9-position automatic sample holder

Contact

In order to book the equipment and for additional information, please contact Claudia Pérez ()