Center for Research in Multiscale Science and Engineering

Atomic Force Microscopy

Description

Atomic force microscopy (AFM) is a technique in which a sharp physical probe senses the surface locally. To acquire an image the physical probe (tip) is moved on a raster scan over small areas of the sample, measuring the local properties simultaneously. Depending on the interaction between the tip and sample surface, AFM can unveil information about the topography, magnetic structure, electric charge distribution, material contrast, work function, etc. with a resolution below nm. We have 2 AFM VEECO microscopes available.

Key features VEECO Dimension 3100

  • NanoScope V controller fitted.
  • AFM (tapping/contact) mode
  • Scanning tunneling microscopy (STM)
  • Magnetic force microscopy (MFM)
  • Motorized sample stage with 120-100 mm (X-Y) travel range (chuck for up to 8'' wafers)
  • 90x90 μm scan size (X-Y), up to 6 μm in Z direction

Key features VEECO Multimode

  • NanoScope 3D controller fitted
  • AFM (contact/tapping) mode in air or liquids
  • Cooling/Heating controller. Measurements in the temperature range of -35ºC up to 250ºC
  • Scan size up to 10 µm in the X-Y plain, and a Z range up to 2.5 µm
  • Sample size up to 15 mm in diameter having a maximum thickness of 6 mm.

Contact

In order to book the equipment, please contact Trifon Trifonov ().